Difference between revisions of "Lab Manual: Limits of Detection"
From Course Wiki
(Created page with "Category:Lab Manuals Category:20.309 Category:AFM Category:Optical Trapping Lab Category:Limits of detection {{Template:20.309}} ==Overview== ==Resolution l...") |
(→Second order system) |
||
Line 11: | Line 11: | ||
===Second order system=== | ===Second order system=== | ||
+ | [[Image:Ideal Mechanical and Electronic Lumped Elements.png|thumb|right|350 px|Ideal mechanical and electronic lumped elements.]] | ||
===Underdamped system: atomic force microscope=== | ===Underdamped system: atomic force microscope=== |