Difference between revisions of "Lab Manual: Limits of Detection"
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===Second order system=== | ===Second order system=== | ||
− | [[Image:Second Order Circuit.png|thumb | + | [[Image:Second Order Circuit.png|thumb|right|Second order circuit with alternating current source and parallel resistor, capacitor, and inductor.]] |
− | <math>Z_{eq}=\ | + | ::<math>\dfrac{1}{Z_{eq}}=\dfrac{1}{Z_R}+\dfrac{1}{Z_L}+\dfrac{1}{Z_C}</math> |
− | <math>\frac{\hat{V}_o(s)}{\hat{I}_{in}(s)}=\frac{RLs}{LCs^2+ | + | |
+ | ::<math>Z_{eq}=\frac{Z_R Z_L Z_C}{Z_R Z_L + Z_R Z_C + Z_L Z_C}</math> | ||
+ | |||
+ | ::<math>Z_{eq}=\frac{\hat{V}_o(s)}{\hat{I}_{in}(s)}=\frac{RL/C}{RLs+\dfrac{R}{Cs}+\dfrac{L}{C}}=\frac{Ls}{LCs^2+\dfrac{L}{R}s+1}</math> | ||
===Mechanical circuit analogy=== | ===Mechanical circuit analogy=== | ||
− | [[Image:Ideal Mechanical and Electronic Lumped Elements.png|thumb|right | + | [[Image:Ideal Mechanical and Electronic Lumped Elements.png|thumb|right|Ideal mechanical and electronic lumped elements.]] |
+ | |||
+ | <math>\frac{\hat{V}_o(s)}{\hat{F}_{in}(s)}=\frac{\dfrac{1}{kb}s}{\dfrac{m}{k} s^2+ \dfrac{m}{b} s+1}</math> | ||
===Underdamped system: atomic force microscope=== | ===Underdamped system: atomic force microscope=== |
Revision as of 03:26, 25 November 2012
Overview
Resolution limit
Second order system
- $ \dfrac{1}{Z_{eq}}=\dfrac{1}{Z_R}+\dfrac{1}{Z_L}+\dfrac{1}{Z_C} $
- $ Z_{eq}=\frac{Z_R Z_L Z_C}{Z_R Z_L + Z_R Z_C + Z_L Z_C} $
- $ Z_{eq}=\frac{\hat{V}_o(s)}{\hat{I}_{in}(s)}=\frac{RL/C}{RLs+\dfrac{R}{Cs}+\dfrac{L}{C}}=\frac{Ls}{LCs^2+\dfrac{L}{R}s+1} $
Mechanical circuit analogy
$ \frac{\hat{V}_o(s)}{\hat{F}_{in}(s)}=\frac{\dfrac{1}{kb}s}{\dfrac{m}{k} s^2+ \dfrac{m}{b} s+1} $